Koyo Technos manufactured probe guard for semiconductor wafer inspection.
High-speed multi-inspection has become possible.
The vertical probe VBP-C method enables high-speed multi-testing.
- Company:コーヨーテクノス
- Price:Other
1~1 item / All 1 items
High-speed multi-inspection has become possible.
The vertical probe VBP-C method enables high-speed multi-testing.